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Fabrication and Inspection
With experience of orientating and fabricating high quality
nonlinear optical crystals, our supplier assures that the control of the
orientation of the crystal optical axis is precisely maintained from the first
cut through final assembly.
X-ray diffraction measurement instruments are used in each
process to ensure crystalline axis alignment to within 10 arc minutes for
waveplates. Each waveplate produced is then inspected using the following
methods.
 1. Dimension (aperture and thickness) and tolerance:
instrument by NIKON digital micrometer, read resolution: 0.001mm.
2. Flatness and wavefront distortion: instrument by
Zygo GPI-XP interferometer.
3. Surface quality: inspected by human eyes with a 10 x
magnifier.
4. Axis orientation and tolerance: instrument by X-ray
diffractometer, resolution: 5 seconds.
5. Phase Retardation: waveplate inspector, tolerance:
lambda/500.
6. Wavelength control: standard laser source: 632.8nm
He-Ne Laser tube, wavelength compensation and calibration is achieved by
analytic formula and software. |
